The WLXJ21 series reflected light inspection microscope is the newest medium inspection microscope in China. The adoption of reflected coaxial illumination ensures the bright-field observation. It can be connected with 135 camera, digital camera and image quantitative analysis. This instrument is suitable for the inspection requirements of a variety of electronic components including magnetic heads, LCD, and semiconductors. Its compact size, ease of operation, 8" x 8" stage travel and cost-effectiveness makes the AL-2 an ideal inspection microscope offering superb operational versatility.
The instrument is equipped with plan objective and wide-field eyepiece and obtains clear and smooth image. The unique character is the super large stage which can make quick-handed and knob-fine movement. The samples on the stage can be moved vertically and horizontally.
Technological Parameter
| 1 |
Objective (Quadruple Nosepiece) |
| |
| Objective |
N.A. |
Effective Working Distance |
Medium |
| 4X |
0.10 |
17.912mm |
Dry |
| 10X |
0.25 |
6.544mm |
Dry |
| 20X |
0.40 |
1.05mm |
Dry |
| 40X |
0.65 |
0.736mm |
Dry | |
| 2 |
Eyepiece : WF10X (Field diameter: 18mm) |
| 3 |
Total magnification: 40X-400X |
| 4 |
Size of the stage : 350mm X 255mm |
| 5 |
Vertical movement : 200mm |
| 6 |
Horizontal movement: 200mm |
| 7 |
110V or 220V / 12V, 20W Illumination | |
