Search:
Home >>   Product >> Measuring Microscopes
CATEGORY
 
XQ15-GⅠ Laser Plane Interferometer
XQ15-GⅠ Laser Plane Interferometer
 

Application:
XQ15-GI laser plane interferometer is applied to measuring planeness of surface and a little angle of both plane and uniform of optical material, measuring error of wavefront for thin plate etc. It can be used to metrological room in factory and research institute.

Feature:
It is better quality of interference fringe of lock and vibration-proof than other the same as products in market. One that offers very clear field of view and very large working room for inspecting a lot of areas mirror in used of the great mass of production.

 

 Technical Data :
 First standard plane (A ), Working diameter D=φ146mm,planeness of the surface
  less than 0.03μm ( λ/20 )
 Second standard plane (B), Working diameter D=φ140mm,planeness of the surface
  less than 0.03μm ( λ/20 )
 Collimating system Working diameter D=φ146mm,Focal length f=400mm
 Light source Laser ZN18(He-Ne)
 Dimension of Interference room φ480 × 380 × 285mm
     
 

Go Back Top  

Copyright © 2003-2008 Alltion Microscope Co., Ltd. All Rights Reserved